Get Blown at the Airport!
Posted on February 4th, 2008 at 7:26 pm by Steve

…thanks to the GE Entry ScanĀ® System, I got blown at Palm Beach International Airport (PBI)! Boy, was it…creepy.

According to the GE Security Products Web Site, the Entry ScanĀ® 7017C is capable of detecting both explosives (in negative ion mode) and narcotics (in positive ion mode) present at the picogram (billionths of a gram) level… on your person, on your clothing, even in your pocket lint.